Brian Gorman
	Brian P. Gorman, Ph.D. Assistant Professor Director, Electron and Ion Microscopy Laboratory   phone: 940-891-6778 email: emlab@unt.edu   Energy Materials Laboratory (link forthcoming)   Electron and Ion Microscopy Laboratory   Classes MSE 6400 Advanced Electron Microscopy (with Laboratory)   MSE 5800 Scanning Electron and Ion Microscopy (with Laboratory)   MSE 5600 Materials Characterization       VITA
Research Interests: • Nanostructured inorganic materials processing and characterization with a thin film emphasis • Characterization of thin films and ceramic interfaces using HRSTEM, TED,    FESEM, XRD, and optical techniques • Low temperature processing of nanoscale fuel cells, low-k dielectrics, and optoelectronics using    precursor, sol-gel, and colloidal depositions • Interfacial studies, epitaxial growth, texturing, and grain growth in thin films
Education: Ph. D., 2003, Ceramic Engineering, University of Missouri – Rolla, advisor Harlan U. Anderson “Processing and Characterization of Thin Film Solid Oxide Fuel Cell Structures” M. S., 2000, Ceramic Engineering, University of Missouri – Rolla “Microstructure Development in Unsupported Thin Films” B. S., 1996, Ceramic Engineering, University of Missouri – Rolla Minor: Art (Film), Physics
Select Publications:

B. P. Gorman, “Interlayer Dielectrics for Semiconductor Technologies”, MRS Bulletin, Book Review (August 2005). 

C. L. Littler, B. P. Gorman, D. F. Weirauch, P. K. Liao, H. F. Schaake, “Thickness, Temperature, and Interfacial Composition Effects in MCT grown by LPE on CZT”, J. Electronic Materials, 34, 768 (2005). 

B. P. Gorman and H. U. Anderson, “Processing of Thin Film Composite Solid Oxide Fuel Cells”, Journal of the American Ceramic Society, 88, 1747 (2005). 

Arup Neogi, Brian P. Gorman, Hadis Morkoç, Tadashi Kawazoe, Motoichi Ohtsu, “Near-field Optical Spectroscopy and Microscopy of Self-assembled GaN/AlN nanostructures”,  Applied Physics Letters, 86, 043103 (2005).  Publication also listed in Jan. 31, 2005 issue of the Virtual Journal of Nanoscale Science and Technology.

B. P. Gorman, A. G. Norman, R. Lukic-Zrnic, H. Moutinho, T. D. Golding and C. L. Littler, “Atomic Ordering Induced Bandgap Reductions in GaAsSb Epilayers Grown by Molecular Beam Epitaxy,” Journal of Applied Physics, 97, 063701 (2005).

R. A. Orozco-Teran, B. P. Gorman, D. W. Mueller, M. R. Baklanov, and R. F. Reidy, “Effect of Silylation on TEFS Xerogel Films by Means of Atmospheric Pressure Drying”, Thin Solid Films, 471, 145 (2005).

Cottier, R.J., Amir, F.Z.; Hossain, K.; House, J.B.; Gorman, B.P.; Perez, J.M.; Holland, O.W.; Golding, T.D.; Stokes, D.W., “MBE Growth of Fe(Si_1-xGe_x)₂”, Journal of Vacuum Science & Technology B (Microelectronics and Nanometer Structures), 23 (3), 1299 (2005).

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